May the force be with you

Nature Nanotechnology

Volumn 4, Issue 5, 2009, Pages 271-

[No Author Info available]

Author keywords

[No Author keywords available]

Indexed keywords

NANOTECHNOLOGY;

NANOSTRUCTURED MATERIALS;

ATOMIC FORCE MICROSCOPY; EDITORIAL; ELECTROMAGNETIC FIELD; FORCE; GRAVITY; OPTICAL TWEEZERS; PHYSICS; PRIORITY JOURNAL; BIOCHEMISTRY; CHEMISTRY; MECHANICAL STRESS; METHODOLOGY; MICROMANIPULATION; NANOTECHNOLOGY; ULTRASTRUCTURE;

BIOPOLYMER; NANOMATERIAL;

BIOCHEMISTRY; BIOPOLYMERS; MICROMANIPULATION; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; NANOTECHNOLOGY; STRESS, MECHANICAL;

EID: 67049158561     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2009.95     Document Type: Editorial

References (9)

1. Gerber, Ch. & Lang, H. P. Nature Nanotech. 1, 3-5 (2006).
2. Nature Nanotech. 3, 241 (2008).
3. Neuman, K. C. & Nagy, A. Nature Methods 5, 491-505 (2008).
4. Mizuno, D. et al. Phys. Rev. Lett. 102, 168102 (2009).
5. Hickenboth, C. R. et al. Nature 446, 423-427 (2007).
6. Piermattei, A. et al. Nature Chem. 1, 133-137 (2009).
7. Wilczek, F. Physics Today 57, 11-12 (October 2004);
8. 57, 10-11 (December 2004);
9. 58, 10-11 (July 2005).