Enhanced third-order nonlinear effects in slow- Light photonic-crystal slab waveguides of line-defect

Optics Express

Volumn 17, Issue 9, 2009, Pages 7206-7216

  Inoue, Kuon ^a   Oda, Hisaya ^a   Ikeda, Naoki ^b   Asakawa, Kiyoshi ^b  

^a CHITOSE INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM GALLIUM ARSENIDE; CRYSTAL DEFECTS; DEFECTS; LASER PULSES; LUMINESCENCE OF ORGANIC SOLIDS; MODULATION; NONLINEAR OPTICS; OPTICAL SWITCHES; PHASE MODULATION; PHASE SHIFT; PHOTONIC CRYSTALS; REFRACTIVE INDEX; SELF PHASE MODULATION; SLOW LIGHT; TWO PHOTON PROCESSES; WAVEGUIDES;

ALL OPTICAL SWITCH; CROSS PHASE MODULATION; CROSS-SECTION AREA; NONLINEAR REFRACTIVE INDEX; PHOTONIC CRYSTAL-SLAB WAVEGUIDES; THIRD-ORDER NONLINEAR EFFECT; THIRD-ORDER NONLINEAR OPTICAL; TWO PHOTON ABSORPTION;

OPTICAL KERR EFFECT;

ARTICLE; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; CRYSTALLIZATION; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LIGHT; METHODOLOGY; NONLINEAR SYSTEM; PHOTON; RADIATION SCATTERING; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; THEORETICAL MODEL; TRANSDUCER;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; CRYSTALLIZATION; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LIGHT; MODELS, THEORETICAL; NONLINEAR DYNAMICS; PHOTONS; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY; TRANSDUCERS;

EID: 66949114312     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.007206     Document Type: Article

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