Measurements of LEDs spectral characteristics and junction temperature

Guangzi Xuebao/Acta Photonica Sinica

Volumn 38, Issue 5, 2009, Pages 1069-1073

  Liu, Li Ming ^a   Zheng, Xiao Dong ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Junction Temperature; LED; Non contact; Peak wavelength; Spectral characteristics

Indexed keywords

EID: 66849128972     PISSN: 10044213     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

1. Zhao Hua-Long, Liang Zhi-Yi, Shi Xing-Chun, et al. The design of LED using in optical projector[J]. Acta Photonica Sinica, 2007, 36(2):244-246.
2. Shen Mo, Li Hai-Feng, Lu Wei, et al. The method of reflective fly eye lens design for LED illuminating projection system[J]. Acta Photonica Sinica, 2006, 35(1):93-95.
3. Narendran N, Bullough J, Maliyagoda N, et al. What is useful life for white LEDs[J]. J Illum Eng Soc, 2001, 30(1):57-67.
4. Gu Y M, Nadarajah N, Freyssinier J P. White LED performance[C]. SPIE, 2004, 5530:119-124.
5. Yanagisawa T. The degradation of GaAlAs red light-emitting diodes under continuous and low-speed pulse operations[J]. Microelectronics and Reliability, 1998, 38(10):1627-1630.
6. Chen Ting, Chen Zhi-Zhong, Lin Liang, et al. Methods for determining junction temperature of GaN-based white LEDs[J]. Chinese Journal of Luminescence, 2006, 27(3):408-412.
7. Li Bing-Qian, Bu Liang-Ji, Gan Xiong-Wen, et al. Research on the relationship of the change in forward voltage with temperature of light emitting diode[J]. Acta Photonica Sinica, 2003, 32(11): 1349-1351.
8. Ma Chun-Lei, Bao Chao. Study on measurement method of thermal performances for high power LED and its applications[J]. Acta Photonica Sinica, 2005, 34(12):1803-1806.
9. Hong E, Narendran N. A method for projecting useful life of LED lighting systems[C]. SPIE, 2003, 5187:93-99.
10. Gu Y, Narendran N. A non-contact method for determining junction temperature of phosphor-converted white LEDs[C]. SPIE, 2003, 5187:107-114.
11. Xi Y, Schubert E F. Junction-temperature measurement in GaN ultraviolet light-emitting diodes using diode forward voltage method[J]. Applied Physics Letters, 2004, 85(12):2163-2165.