Environmental exposure tracking sensor

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7290, Issue , 2009, Pages

  Havens, Teresa ^a   Everhart, Joel ^a   McFerran, Jace ^b  

^a Cornerstone Research Group ^*  (United States)

^b NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

Humidity sensor; Product freshness; RFID; Thermal sensor

Indexed keywords

CORNERSTONE RESEARCH GROUP INC.; CUMULATIVE EXPOSURES; DEGRADATION PROFILES; DIGITAL MEMORY; ELASTIC STATE; ENVIRONMENTAL EXPOSURE; MATERIAL SYSTEMS; MOISTURE EXPOSURE; PERISHABLE ITEMS; PHASE I; POWER SUPPLY; PRODUCT FRESHNESS; REAL-TIME INFORMATION; RELIABILITY APPLICATIONS; RFID; SCALING-UP; SENSOR DESIGNS; SHAPE MEMORY POLYMERS; THERMAL EXPOSURE; THERMAL SENSOR; TWO-MATERIALS;

AMMUNITION; CONCRETE BRIDGES; DEGRADATION; DYNAMIC RESPONSE; HUMIDITY SENSORS; MOISTURE; MONITORING; SHAPE MEMORY EFFECT; THERMOSETS; VAPOR PRESSURE; WATER VAPOR;

HUMIDITY CONTROL;

EID: 66749169700     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.815303     Document Type: Conference Paper

References (0)