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2
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33751141500
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Shechtman, D.1
Blech, I.2
Gratias, D.3
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5
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0002708778
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D. DiVincenzo, P. J. Steinhardt, Eds. World Scientific, Singapore
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P. A. Bancel, Quasicrystals: The State of the Art, D. DiVincenzo, P. J. Steinhardt, Eds. (World Scientific, Singapore, 1991), pp. 17-56.
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Bancel, P.A.1
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7
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0035981030
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P. J. Lu, K. Deffeyes, P. J. Steinhardt, N. Yao, Phys. Rev. Lett. 87, 275507 (2001).
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Lu, P.J.1
Deffeyes, K.2
Steinhardt, P.J.3
Yao, N.4
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11
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66749085071
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The instrument was a Zeiss-EVO MA15 scanning electron microscope coupled with an Oxford INCA250 energy-dispersive spectrometer, operated with 25-kV accelerating voltage, 500-pA probe current, 2500 counts per second as average count rate on the whole spectrum, and counting time of 100 s. Samples were sputtered with 30-nm-thick carbon film.
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The instrument was a Zeiss-EVO MA15 scanning electron microscope coupled with an Oxford INCA250 energy-dispersive spectrometer, operated with 25-kV accelerating voltage, 500-pA probe current, 2500 counts per second as average count rate on the whole spectrum, and counting time of 100 s. Samples were sputtered with 30-nm-thick carbon film.
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-
-
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12
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66749092978
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The instrument was a JEOL JXA-8600 electron microprobe, using a 20-kV accelerating voltage; 40-nA beam current; 30-s counting time; and Al-Kα, Cu-Kα, and Fe-Kα lines.
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The instrument was a JEOL JXA-8600 electron microprobe, using a 20-kV accelerating voltage; 40-nA beam current; 30-s counting time; and Al-Kα, Cu-Kα, and Fe-Kα lines.
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-
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14
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66749184136
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The instrument was an Oxford Diffraction Excalibur PX Ultra diffractometer with a 165-mm diagonal Onyx charge-coupled device detector at 2.5:1 demagnification. The program Crysalis RED (Oxford Diffraction 2006) was used to convert the observed diffraction rings into a conventional XRD pattern.
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The instrument was an Oxford Diffraction Excalibur PX Ultra diffractometer with a 165-mm diagonal Onyx charge-coupled device detector at 2.5:1 demagnification. The program Crysalis RED (Oxford Diffraction 2006) was used to convert the observed diffraction rings into a conventional XRD pattern.
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15
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4243765813
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T. C. Lubensky, J. E. S. Socolar, P. J. Steinhardt, P. A. Bancel, P. A. Heiney, Phys. Rev. Lett. 57, 1440 (1986).
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Lubensky, T.C.1
Socolar, J.E.S.2
Steinhardt, P.J.3
Bancel, P.A.4
Heiney, P.A.5
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16
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66749120750
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-7 torr; the electron beam size ranged from 50 nm to 0.3 μm.
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-7 torr; the electron beam size ranged from 50 nm to 0.3 μm.
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17
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0001597398
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D. Levine, T. C. Lubensky, S. Ostlund, S. Ramaswamy, P. J. Steinhardt, J. Toner, Phys. Rev. Lett. 54, 1520 (1985).
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Levine, D.1
Lubensky, T.C.2
Ostlund, S.3
Ramaswamy, S.4
Steinhardt, P.J.5
Toner, J.6
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20
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66749083305
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note
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We are indebted to L. Hollister and G. MacPherson for their critical examination of the results, especially regarding the issue of natural origin. We also thank P. Bonazzi, K. Deffeyes, S. Menchetti, and P. Spry for useful discussions and S. Bambi at the Museo di Storia Naturale for the photograph of the original sample in Fig. 1A. L.B. thanks the Ministerio dell'lstruzione dell'Università e della Ricerca Programma di Ricerca Nazionale 2007 project "Complexity in minerals: modulation, phase transition, structural disorder," issued to S. Menchetti. This work was supported in part by U.S. Department of Energy grant DE-FG02-91ER40671 (P.J.S.), the NSF MRSEC program through New York University (grant DMR-0820341; P.J.S.), the Princeton Center for Complex Materials (grant DMR-0819860; N.Y.), and the New Jersey Commission of Science and Technology (N.Y.).
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