Robust anatomy detection from CT topograms

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 7260, Issue , 2009, Pages

  Peng, Zhigang ^a   Zhan, Yiqiang ^a   Zhou, Xiang Sean ^a   Krishnan, Arun ^a  

^a SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC METHOD; DETECTION RATES; EXISTING METHOD; EXPERIMENTAL VALIDATIONS; FALSE DETECTIONS; LANDMARKS DETECTION; LOCAL FEATURE; ROBUST PERFORMANCE; SPATIAL CONFIGURATION; TESTING DATA; TOPOGRAM; WORK-FLOW;

COMPUTATIONAL EFFICIENCY; LATTICE CONSTANTS; MEDICAL IMAGING;

COMPUTER AIDED DIAGNOSIS;

EID: 66749121987     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.813689     Document Type: Conference Paper

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