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Volumn 53, Issue 2, 2009, Pages 109-110

Surface Characterisation of Heterogeneous Catalysts by XPS: Part II
[No Author Info available]

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER; CATALYST CHARACTERIZATION; CATALYST MATERIAL; CHEMICAL COMPOSITIONS; CHEMICAL INFORMATION; COMPARATIVE STUDIES; CORE LEVELS; ELECTRICAL CHARGES; HETEROGENEOUS CATALYST; KEY COMPONENT; MATERIAL'S SURFACE; PURE METALS; QUANTITATIVE TOOL; SURFACE CHARACTERISATION; SURFACE CHARACTERIZATION; XPS; XPS SPECTRA;

EID: 66749112526     PISSN: None     EISSN: 14710676     Source Type: Journal    
DOI: 10.1595/147106709X432943     Document Type: Article
Times cited : (6)

References (4)
  • 3
    • 66749102874 scopus 로고    scopus 로고
    • Kai M. Siegbahn, The Nobel Prize in Physics 1981, Curriculum Vitae: http://nobelprize.org/nobel-prizes/physics/laureates/1981/siegbahn-cv.ht ml (Accessed on 4th March 2009)
    • Kai M. Siegbahn, The Nobel Prize in Physics 1981, Curriculum Vitae: http://nobelprize.org/nobel-prizes/physics/laureates/1981/siegbahn-cv.html (Accessed on 4th March 2009)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.