Roughness exponent of domain interface in CoFe/Pt multilayer films

IEEE Transactions on Magnetics

Volumn 45, Issue 6, 2009, Pages 2548-2550

  Lee, Kang Soo ^a   Lee, Chang Won ^b   Cho, Young Jin ^b   Seo, Sunae ^b   Kim, Dong Hyun ^c   Choe, Sug Bong ^a  

^a Seoul National University   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c Chungbuk National University   (South Korea)

Author keywords

Domain wall; Quenched disorder; Roughness exponent; Scaling behavior

Indexed keywords

DOMAIN WALLS; ISING MODEL; MAGNETIC DOMAINS; MULTILAYERS; SCALING LAWS;

CRITICALITY CLASS; DOMAIN-WALL PROPAGATION; INTERFACE PROFILES; QUENCHED DISORDER; RANDOM FIELD ISING MODELS; ROUGHNESS EXPONENT; SCALING BEHAVIOR; SINGLE LAYER FILMS;

MULTILAYER FILMS;

EID: 66549124198     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2009.2018877     Document Type: Article

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