Characterization of integrated photonic devices with minimum phase technique

Optics Express

Volumn 17, Issue 10, 2009, Pages 8349-8361

  Halir, R ^a   Molina Fernandez I ^a   Wanguemert Perez J G ^a   Ortega Monux A ^a   De Oliva Rubio, J ^a   Cheben, P ^b  

^a UNIVERSITY OF MÁLAGA   (Spain)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; INFORMATION FILTERING; PHOTONIC DEVICES; REFRACTIVE INDEX; SILICON ON INSULATOR TECHNOLOGY;

ANTI REFLECTIVE COATINGS; DEVICE CHARACTERISTICS; EXPERIMENTAL CHARACTERIZATION; HIGH REFRACTIVE INDEX; INTEGRATED OPTICAL DEVICES; INTEGRATED PHOTONIC DEVICES; MULTI-MODE INTERFERENCE; SILICON-ON- INSULATORS (SOI);

TIME DOMAIN ANALYSIS;

EID: 66449088565     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.008349     Document Type: Article

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