Low coherence interferometry for central thickness measurement of rigid and soft contact lenses

Optics Express

Volumn 17, Issue 11, 2009, Pages 9157-9170

  Verrier, I ^a   Veillas, C ^a   Lepine T ^a,b  

^a UNIVERSITÉ JEAN MONNET   (France)

^b INSTITUT D'OPTIQUE GRADUATE SCHOOL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT LENSES; CORRELATION DETECTORS; FIBER OPTIC SENSORS; LENSES; OPTICAL FIBERS; OPTICALLY PUMPED LASERS; PUMPING (LASER); THICKNESS GAGES; THICKNESS MEASUREMENT; WAVE INTERFERENCE;

LOW COHERENCE INTERFEROMETRY; MEASUREMENT RESOLUTION; MICRO-STRUCTURED OPTICAL FIBERS; MICROCHIP LASERS; NUMERICAL TREATMENTS; OPTIMAL CORRELATION; SIGNAL RECORDING; SOFT CONTACT LENS;

INTERFEROMETRY;

ARTICLE; COMPARATIVE STUDY; CONTACT LENS; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; ILLUMINATION; INSTRUMENTATION; INTERFEROMETRY; METHODOLOGY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

CONTACT LENSES; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INTERFEROMETRY; LIGHTING; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 66449083823     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.009157     Document Type: Article

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