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Volumn 21, Issue 4, 1998, Pages 306-315

Electrical characterization of thin film integral passive devices on polyimide-based packaging structures

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM SILICIDE RESISTORS; SPIRAL COPPER INDUCTORS; TANTALUM OXIDE DIELECTRIC CAPACITORS; THIN FILM INTEGRAL PASSIVE DEVICES;

EID: 6644222465     PISSN: 10631674     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (8)
  • 6
    • 0024890003 scopus 로고    scopus 로고
    • Tantalum Oxide Thin-film Capacitor Suitable for Being Incorporated into an Integrated Package
    • Hiroshi Yoshino, Tomohiko Ihara, Shosaku Yamanaka, and Takashi Igarashi, "Tantalum Oxide Thin-film Capacitor Suitable for Being Incorporated Into an Integrated Package", IEEE/CHMT '98 Japan IEMT Symposium, pg. 156, 1998.
    • (1998) IEEE/CHMT '98 Japan IEMT Symposium , pp. 156
    • Yoshino, H.1    Ihara, T.2    Yamanaka, S.3    Igarashi, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.