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Volumn 21, Issue 4, 1998, Pages 306-315
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Electrical characterization of thin film integral passive devices on polyimide-based packaging structures
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Author keywords
[No Author keywords available]
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Indexed keywords
CHROMIUM SILICIDE RESISTORS;
SPIRAL COPPER INDUCTORS;
TANTALUM OXIDE DIELECTRIC CAPACITORS;
THIN FILM INTEGRAL PASSIVE DEVICES;
CAPACITANCE;
CAPACITORS;
ELECTRIC INDUCTORS;
ELECTRIC RESISTANCE;
ELECTRONICS PACKAGING;
PASSIVE NETWORKS;
POLYIMIDES;
RESISTORS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE STRUCTURES;
THIN FILM DEVICES;
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EID: 6644222465
PISSN: 10631674
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (6)
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References (8)
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