Optical and structural characterization of copper indium disulfide thin films

Materials and Design

Volumn 22, Issue 7, 2001, Pages 585-589

  Henderson, D O ^a   Mu, R ^a   Ueda, A ^a   Wu, M H ^a   Gordon, E M ^a   Tung, Y S ^a   Huang, M ^a   Keay, J ^a   Feldman, L C ^a   Hollingsworth, J A ^a   Buhro, W E ^a   Harris, J D ^a   Hepp, A F ^a   Raffaelle, R P ^a  

^a FISK UNIVERSITY   (United States)

Author keywords

Optical; Semi conductors; Vapour deposition

Indexed keywords

CHEMICAL VAPOR DEPOSITION; COPPER COMPOUNDS; LIGHT TRANSMISSION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPECTROSCOPIC ANALYSIS; STOICHIOMETRY; SYNTHESIS (CHEMICAL);

PHONON BANDS;

THIN FILMS;

FILM;

EID: 6644221053     PISSN: 02641275     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0261-3069(01)00019-X     Document Type: Article

References (12)