Profilometry and optical slicing by passive three-dimensional imaging

Optics Letters

Volumn 34, Issue 7, 2009, Pages 1105-1107

  Panah, Mehdi Danesh ^a   Javidi, Bahram ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICS; OPTOELECTRONIC DEVICES;

ENABLING TECHNOLOGIES; LAMBERTIAN SURFACES; MULTIPERSPECTIVE IMAGING; OPTICAL SLICING; PERSPECTIVE IMAGE; SPECTRAL RADIATION; THREE DIMENSIONAL (3-D) IMAGING; THREE DIMENSIONAL IMAGING;

PROFILOMETRY;

EID: 66349118940     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.34.001105     Document Type: Article

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