Detector solid angle formulas for use in X-ray energy dispersive spectrometry

Microscopy and Microanalysis

Volumn 15, Issue 2, 2009, Pages 93-98

  Zaluzec, Nestor J ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Collection efficiency; EDS; SDD; Si(Li); Solid angle; X ray detectors; XEDS

Indexed keywords

LITHIUM; NANOMATERIAL; SILICON;

ARTICLE; CHEMISTRY; EVALUATION; INSTRUMENTATION; METHODOLOGY; SPECTROMETRY;

LITHIUM; NANOSTRUCTURES; SILICON; SPECTROMETRY, X-RAY EMISSION;

EID: 66349112691     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609090217     Document Type: Article

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