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Volumn 102, Issue 21, 2009, Pages

4f-derived fermi surfaces of CeRu2(Si1-xGex)2 near the quantum critical point: Resonant soft-X-ray ARPES study

(13) Okane, T a Ohkochi, T a Takeda, Y a Fujimori, S I a Yasui, A a Saitoh, Y a Yamagami, H a,b Fujimori, A a,c Matsumoto, Y d Sugi, M d Kimura, N d Komatsubara, T d Aoki, H d

a JAPAN ATOMIC ENERGY AGENCY (Japan)

b KYOTO SANGYO UNIVERSITY (Japan)

c UNIVERSITY OF TOKYO (Japan)

d TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

4F-ELECTRONS; ANGLE RESOLVED PHOTOELECTRON SPECTROSCOPY; CERU2SI2; CRITICAL COMPOSITION; EXCITATION REGION; F-ELECTRON; PARAMAGNETIC STATE; QUANTUM CRITICAL POINTS; QUANTUM CRITICALITY; SI1-XGEX; SOFT-X-RAY;

CERIUM; CERIUM COMPOUNDS; CRITICALITY (NUCLEAR FISSION); ELECTRONS; EQUATIONS OF STATE; FERMI SURFACE; PHOTOELECTRON SPECTROSCOPY; THREE DIMENSIONAL; X RAY PHOTOELECTRON SPECTROSCOPY;

FERMIONS;

EID: 66349093362 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.102.216401 Document Type: Article

Times cited : (34)

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