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Volumn 34, Issue 7, 2009, Pages 1063-1065
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Three-dimensional force measurements in optical tweezers formed with high-NA micromirrors
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
SPECTRUM ANALYSIS;
STIFFNESS;
AXIAL DIRECTION;
BACK-FOCAL-PLANE INTERFEROMETRIES;
MICRO MIRROR;
MICROSCOPE OBJECTIVE;
POLYSTYRENE SPHERES;
STIFFNESS VALUES;
THREE DIMENSIONAL FORCES;
TRAP STIFFNESS;
OPTICAL TWEEZERS;
POLYSTYRENE DERIVATIVE;
ARTICLE;
CHEMISTRY;
ELECTRONICS;
EQUIPMENT DESIGN;
IMAGE PROCESSING;
INSTRUMENTATION;
INTERFEROMETRY;
LASER;
LIGHT;
METHODOLOGY;
OPTICAL TWEEZERS;
OPTICS;
RADIATION SCATTERING;
REPRODUCIBILITY;
SPECTROPHOTOMETRY;
STATISTICAL MODEL;
THREE DIMENSIONAL IMAGING;
EQUIPMENT DESIGN;
IMAGE PROCESSING, COMPUTER-ASSISTED;
IMAGING, THREE-DIMENSIONAL;
INTERFEROMETRY;
LASERS;
LIGHT;
MINIATURIZATION;
MODELS, STATISTICAL;
OPTICAL TWEEZERS;
OPTICS AND PHOTONICS;
POLYSTYRENES;
REPRODUCIBILITY OF RESULTS;
SCATTERING, RADIATION;
SPECTROPHOTOMETRY;
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EID: 66349086189
PISSN: 01469592
EISSN: 15394794
Source Type: Journal
DOI: 10.1364/OL.34.001063 Document Type: Article |
Times cited : (14)
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References (20)
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