SCOPUS 정보 검색 플랫폼

Volumn , Issue , 2008, Pages 168-172

Distance measure between vague sets

Author keywords

Distance measure; Pattern recognition; Similarity measure; Vague sets

Indexed keywords

DISTANCE MEASURE; SIMILARITY MEASURE; VAGUE SETS;

PATTERN RECOGNITION;

EID: 66249118692 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/ICACIA.2008.4769997 Document Type: Conference Paper

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.