When fewer photons do more: A comparative O2 photoadsorption study on vapor-deposited TiO2 and ZrO2 nanocrystal Ensembles

Journal of Physical Chemistry C

Volumn 113, Issue 21, 2009, Pages 9175-9181

  Siedl, Nicolas ^a   Elser, Michael J ^a   Halwax, Erich ^b   Bernardi, Johannes ^b   Diwald, Oliver ^a,c  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BAND-GAP EXCITATION; CHARGE SEPARATIONS; CHEMICAL VAPOR; CONCENTRATION OF; DEEP TRAPS; ELECTRON PARAMAGNETIC RESONANCE SPECTROSCOPY; EPR SPECTROSCOPY; GAS ATMOSPHERE; NANOCRYSTAL POWDERS; ORDERS OF MAGNITUDE; OXIDE PARTICLES; PARAMAGNETIC HOLE; PHOTOADSORPTION; PHOTOGENERATION; RECOMBINATION CENTERS; SPECTROSCOPIC PROPERTY; STRUCTURE AND MORPHOLOGY; TIO; UV DIFFUSE REFLECTANCE; UV EXCITATION; UV PHOTONS;

ELECTRON RESONANCE; NANOCRYSTALS; NANOPARTICLES; ORGANIC CHEMICALS; ORGANOMETALLICS; OXYGEN; PARAMAGNETIC MATERIALS; PARAMAGNETIC RESONANCE; PARAMAGNETISM; PHOTONS; SEPARATION; VAPORS; ZIRCONIUM ALLOYS;

ELECTRON SPIN RESONANCE SPECTROSCOPY;

EID: 66149162784     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp9011476     Document Type: Article

References (54)

1. Fujishima, A.; Zhang, X. T.; Tryk, D. A. Surf. Sci. Rep. 2008, 63, 515-582.
2. Thompson, T. L.; Yates, J. T. Chem. Rev. 2006, 106, 4428-4453.
3. Hoffmann, M. R.; Martin, S. T.; Choi, W.; Bahnemann, D. W. Chem. Rev. 1995, 95, 69-96.
4. Kongkanand, A.; Tvrdy, K.; Takechi, K.; Kuno, M.; Kamat, P. V. J. Am. Chem. Soc. 2008, 130, 4007-4015.
5. Riss, A.; Berger, T.; Stankic, S.; Bernardi, J.; Knözinger, E.; Diwald, O. Angew. Chem., Int. Ed. 2008, 47, 1496-1499.
6. Pang, C. L.; Lindsay, R.; Thornton, G. Chem. Soc. Rev. 2008, 37, 2328-2353.
7. Kamat, P. V. J. Phys. Chem. C 2008, 112, 18737-18753.
8. Palomares, E.; Clifford, J. N.; Haque, S. A.; Lutz, T.; Durrant, J. R. J. Am. Chem. Soc. 2003, 125, 475-482.
9. Schattka, J. H.; Shchukin, D. G.; Jia, J. G.; Antonietti, M.; Caruso, R. A. Chem. Mater. 2002, 14, 5103-5108.
10. Hernandez-Alonso, M. D.; Coronado, J. M.; Bachiller-Baeza, B.; Fernandez-Garcia, M.; Soria, J. Chem. Mater. 2007, 19, 4283-4291.
11. Zhou, W.; Liu, K. S.; Fu, H. G.; Pan, K.; Zhang, L. L.; Wang, L.; Sun, C. C. Nanotechnology 2008, 19, 035610.
12. Fresno, F.; Hernandez-Alonso, M. D.; Tudela, D.; Coronado, J. M.; Soria, J. Appl. Catal., B 2008, 84, 598-606.
13. Hernandez-Alonso, M. D.; Tejedor-Tejedor, I.; Coronado, J. M.; Soria, J.; Anderson, M. A. Thin Solid Films 2006, 502, 125-131.
14. Emeline, A. V.; Kuzmin, G. N.; Basov, L. L.; Serpone, N. J. Photochem. Photobiol., A 2005, 174, 214-221.
15. Ryabchuk, V. Int. J. Photoenergy 2004, 6, 95-113, and references therein.
16. Emeline, A. V.; Panasuk, A. V.; Sheremetyeva, N.; Serpone, N. J. Phys. Chem. B 2005, 109, 2785-2792.
17. Ryo, J.; Choi, W. Environ. Sci. Technol. 2008, 42, 294-300.
18. Testino, A.; Bellobono, I. R.; Buscaglia, V.; Canevali, C.; D'Arienzo, M.; Polizzi, S.; Scotti, R.; Morazzoni, F. J. Am. Chem. Soc. 2007, 129, 3564-3575.
19. Feldhoff, A.; Mendive, C.; Bredow, T.; Bahnemann, D. Chem. Phys. Chem. 2007, 8, 805-809.
20. Li, G.; Gray, K. A. Chem. Phys. 2007, 95, 173-187.
21. Gong, X. G.; Selloni, A.; Batzill, M.; Diebold, U. Nat. Mater. 2006, 5, 665-670.
22. Wu, B.; Guo, C.; Zheng, N.; Xie, Z.; Stucky, G. D. J. Am. Chem. Soc. 2008, 130, 17563-17567.
23. Che, M.; Tench, A. J. Adv. Catal. 1983, 32, 1-148.
24. Anpo, M.; Che, M.; Fubini, B.; Garrone, E.; Giamello, E.; Paganini, M. C. Top. Catal. 1999, 8, 189.
25. Carter, E.; Carley, A. F.; Murphy, D. M. J. Phys. Chem. C 2007, 111, 10630-10638.
26. Henderson, M. A.; White, J. M.; Uetsuka, H.; Onishi, H. J. Catal. 2006, 238, 153-164.
27. Berger, T.; Sterrer, M.; Diwald, O.; Knözinger, E. Chem. Phys. Chem. 2005, 6, 2104-2112.
28. Livraghi, S.; Paganini, M. C.; Giamello, E.; Selloni, A.; Di Valentin, C.; Pacchioni, G. J. Am. Chem. Soc. 2006, 128, 15666-15671.
29. Komaguchi, K.; Maruoka, T.; Nakano, H.; Imae, I.; Ooyama, Y.; Harima, Y. J. Phys. Chem. C, in press, 10.1021/jp809851b.
30. 2 Nanocrystals J. Phys. Chem. C, Vol. 113, No. 21, 2009 9181
31. Wang, C.; Heller, A.; Gerischer, H. J. Am. Chem. Soc. 1992, 114, 5230-5234.
32. Henderson, M. A.; White, J. M.; Uetsuka, H.; Onishi, H. J. Catal. 2006, 238, 153-164.
33. Riss, A.; Elser, M. J.; Bernardi, J.; Diwald, O. J. Am. Chem. Soc. 2009, 131, 6198-6206.
34. Benfer, S.; Knözinger, E. J. Mater. Chem. 1999, 9, 1203-1209.
35. Elser, M. J.; Berger, T.; Brandhuber, D.; Bernardi, J.; Diwald, O.; Knözinger, E. J. Phys. Chem. B. 2006, 110, 7605-7608.
36. Takeuchi, M.; Martra, G.; Coluccia, S.; Anpo, M. J. Phys. Chem. C 2007, 111, 9811-9817.
37. Berger, T.; Sterrer, M.; Diwald, O.; Knözinger, E.; Panayotov, D.; Thompson, T. L.; Yates, J. T. J. Phys. Chem. B 2005, 109, 6061-6068.
38. Zubkov, T.; Stahl, D.; Thompson, T. L.; Diwald, O.; Yates, J. T., Jr. J. Phys. Chem. B 2005, 109, 15454-15462.
39. Attwood, A. L.; Murphy, D. M.; Edwards, J. L.; Egerton, T. A.; Harrison, R. W. Res. Chem. Intermed. 2003, 29, 449-465.
40. Berger, T.; Diwald, O.; Knözinger, E.; Napoli, F.; Chiesa, M.; Giamello, E. Chem. Phys. 2007, 339, 138-145.
41. Finazzi, E.; Di Valentin, C.; Pacchioni, G.; Selloni, A. J. Chem. Phys. 2008, 129, 154113.
42. Berger, T.; Diwald, O.; Knözinger, E.; Sterrer, M.; Yates, J. T. Phys. Chem. Chem. Phys. 2006, 8, 1822-1826.
43. Emeline, A. V.; Kuzmin, G. N.; Purevdorj, D.; Ryabchuk, V. K.; Serpone, N. J. Phys. Chem. 1999, 103, 1316-1324.
44. Emeline, A. V.; Kuzmin, G. N.; Purevdorj, D.; Ryabchuk, V. K.; Serpone, N. J. Phys. Chem. B 2000, 104, 2989-2999.
45. Aita, C. R.; Hoppe, E. E.; Sorbello, R. S. Appl. Phys. Lett. 2003, 82, 677-679.
46. Sorbello, R. S.; DeLoach, J. D.; Aita, C. R.; Fejes, P. J. Vac. Sci. Technol., B 2004, 22, 2658-2662.
47. DeLoach, J. D.; Scarel, G.; Aita, C. R. J. Appl. Phys. 1999, 85, 2377-2384.
48. Aita, C. R.; DeLoach, J. D.; Sorbello, R. S. J. Appl. Phys. 2003, 94, 654-663.
49. Liang, L.; Sheng, Y.; Xu, Y.; Wu, D.; Sun, Y. Thin Solid Films 2007, 515, 7765-7771.
50. Gossens, A.; van der Zanden, B.; Schoonman, J. Chem. Phys. Lett. 2000, 331, 1-6.
51. -3 surface atoms is involved in persistent charge trapping as evidenced in the present study.
52. Thompson, T. L.; Yates, J. T., Jr. J. Phys. Chem. B 2006, 110, 7431-7435.
53. Tang, J. R.; Durrant, D. R.; Klug, J. Am. Chem. Soc. 2008, 130, 13885-13891.
54. Li, G. H.; Dimitrijevic, N. M.; Chen, L.; Rajh, T.; Gray, K. A. J. Phys. Chem. C 2008, 112, 19040-19044.