Comments on 'Electric-Field-Assisted Growth of Highly Uniform and Oriented Gold Nanotriangles on Conducting Glass Substrates'

Advanced Materials

Volumn 21, Issue 13, 2009, Pages 1317-1319

  Diao, Peng ^a   Zhang, Dafeng ^a   Guo, Min ^b   Zhang, Qi ^a  

^a BEIHANG UNIVERSITY   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 66149137581     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200801390     Document Type: Note

References (11)

1. P. R. Sajanlal, T. Pradeep, Adv. Mater. 2008, 20, 980.
2. For AFM measurements, the dynamic force mode (DFM) used in ref. [1] is also commonly referred to as tapping mode.
3. SPM Training Notebook, Software Version 3.0, Veeco Instruments Inc, USA, 2003, p. 58.
4. Sajanlal and Pradeep reported in ref. [1] that the average full width at half maximum of the gold nanotriangles prepared after one hour growth is (375±15) nm. However, a careful examination of Fig. 2A and Fig. S6 in ref. [1] reveals that the average edge-length of the gold nanotriangles is in the range of 350-450 nm.
5. S. S. Shankar, A. Rai, B. Ankamwar, A. Singh, A. Ahmad, M. Sastry, Nat. Mater. 2004, 3, 482.
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11. F. Kim, S. Connor, H. Song, T. Kuykendall, P. D. Yang, Angew. Chem. Int. Ed. 2004, 43, 3673.