Direct electron detection for TEM with column parallel CCD

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 604, Issue 1-2, 2009, Pages 108-110

  Moldovan, Grigore ^a   Jeffery, Ben ^a   Nomerotski, Andrei ^a   Kirkland, Angus ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Column parallel charge coupled device; Direct electron detector; Position sensitive particle detector; Transmission electron microscope

Indexed keywords

BEAM TESTS; CLUSTER PROPERTY; COLUMN PARALLEL; COLUMN PARALLEL CHARGE-COUPLED DEVICE; DIRECT ELECTRON DETECTOR; ELECTRON DETECTION; ELECTRON DETECTORS; INTEGRATED INTENSITIES; LATEST DEVELOPMENT; POSITION RESOLUTION; POSITION-SENSITIVE PARTICLE DETECTOR; TEM; TRANSMISSION ELECTRON MICROSCOPE;

CHARGE COUPLED DEVICES; DETECTORS; ELECTRON MICROSCOPES; PARTICLE ACCELERATORS; PARTICLE DETECTORS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR QUANTUM WIRES; SIGNAL TO NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

EID: 66049110564     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.01.038     Document Type: Article

References (4)

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