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Volumn 22, Issue 3-4, 2009, Pages 8-11
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Defect detection by developers
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Author keywords
[No Author keywords available]
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Indexed keywords
DEFECT DETECTION;
SOFTWARE INDUSTRY;
DEFECTS;
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EID: 65949101642
PISSN: None
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (7)
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