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Volumn 22, Issue 3-4, 2009, Pages 8-11

Defect detection by developers

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DETECTION; SOFTWARE INDUSTRY;

EID: 65949101642     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (7)
  • 2
    • 65949083958 scopus 로고    scopus 로고
    • Research Issues in Software Fault Categorization
    • Ploski, Jan, et al. "Research Issues in Software Fault Categorization." ACM SIGSOFT Software Engineering Notes 32(6): 6, 2007.
    • (2007) ACM SIGSOFT Software Engineering Notes , vol.32 , Issue.6 , pp. 6
    • Ploski, J.1
  • 3
    • 65949092724 scopus 로고    scopus 로고
    • Answers.com. Example Is Better Than Precept. 2008 .
    • Answers.com. "Example Is Better Than Precept." 2008 .
  • 4
    • 0033640333 scopus 로고    scopus 로고
    • An Encompassing Life Cycle Centric Survey of Software Inspection
    • Laitenberger, Oliver, and Jean-Marc DeBaud. "An Encompassing Life Cycle Centric Survey of Software Inspection." The Journal of Systems and Software 50(1): 5-31, 2000.
    • (2000) The Journal of Systems and Software , vol.50 , Issue.1 , pp. 5-31
    • Laitenberger, O.1    DeBaud, J.-M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.