Internal fault detection and isolation for paralleled voltage source converters

Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Volumn , Issue , 2009, Pages 833-839

  Zhang, Di ^a   Wang, Fred ^a   Burgos, Rolando ^a   Kern, John ^b   El Barbari, Said ^c   Boroyevich, Dushan ^a  

^a State University   (United States)

^b GE GLOBAL RESEARCH   (United States)

^c GE GLOBAL RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCULATING CURRENT; COMMON DC BUS; DC CURRENT; INTERNAL FAULTS; OPEN CIRCUIT FAULTS; PROTECTION METHODS; PROTECTION SCHEMES; SHORT PERIODS; SHUT DOWN; SINGLE SWITCH; SYSTEMATIC ANALYSIS; VOLTAGE SOURCE CONVERTERS;

ELECTRIC FAULT CURRENTS; POWER ELECTRONICS;

FAULT DETECTION;

EID: 65949093511     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APEC.2009.4802758     Document Type: Conference Paper

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