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Volumn 517, Issue 17, 2009, Pages 4792-4799
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Nanostructural and electrochemical characteristics of cerium oxide thin films deposited on AA5083-H321 aluminum alloy substrates by dip immersion and sol-gel methods
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Author keywords
AA5083 H321; Cerium oxide; Corrosion resistance; Sol gel
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Indexed keywords
3.5%NACL;
AA5083-H321;
AFM;
ALUMINUM ALLOY SUBSTRATE;
CERIUM OXIDE;
CERIUM OXIDES;
CORROSION BEHAVIOR;
EIS TEST;
ELECTROCHEMICAL CHARACTERISTICS;
IMMERSION METHOD;
NANO-SIZED;
NANOSTRUCTURAL;
PHASE PROPERTIES;
PITTING RESISTANCE;
SEM;
SOL-GEL METHODS;
ALUMINA;
ALUMINUM;
ALUMINUM ALLOYS;
CERIUM;
CERIUM COMPOUNDS;
CORROSION RESISTANCE;
ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY;
GELATION;
GELS;
OXIDES;
PROTECTIVE COATINGS;
SODIUM CHLORIDE;
SOL-GEL PROCESS;
SOL-GELS;
SOLS;
OXIDE FILMS;
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EID: 65749101209
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2009.03.046 Document Type: Article |
Times cited : (36)
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References (12)
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