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Volumn 517, Issue 17, 2009, Pages 4792-4799

Nanostructural and electrochemical characteristics of cerium oxide thin films deposited on AA5083-H321 aluminum alloy substrates by dip immersion and sol-gel methods

Author keywords

AA5083 H321; Cerium oxide; Corrosion resistance; Sol gel

Indexed keywords

3.5%NACL; AA5083-H321; AFM; ALUMINUM ALLOY SUBSTRATE; CERIUM OXIDE; CERIUM OXIDES; CORROSION BEHAVIOR; EIS TEST; ELECTROCHEMICAL CHARACTERISTICS; IMMERSION METHOD; NANO-SIZED; NANOSTRUCTURAL; PHASE PROPERTIES; PITTING RESISTANCE; SEM; SOL-GEL METHODS;

EID: 65749101209     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.03.046     Document Type: Article
Times cited : (36)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.