Scintillation characteristics and imaging performance of CsI:Tl thin films for X-ray imaging applications

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 604, Issue 1-2, 2009, Pages 224-228

  Cha, Bo Kyung ^a   Shin, Jeong Hyun ^a   Bae, Jun Hyung ^a   Lee, Chae hun ^a   Chang, Sungho ^a   Kim, Hyun Ki ^a   Kim, Chan Kyu ^a   Cho, Gyuseong ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

CsI:Tl scintillator; Scintillation properties; X ray imaging

Indexed keywords

CCD SENSORS; CESIUM IODIDES; CSI:TL SCINTILLATOR; DOPING CONCENTRATION; EMISSION PEAKS; IMAGING PERFORMANCE; LIGHT INTENSITY; LONG WAVELENGTH; POST-HEAT TREATMENT; RADIOGRAPHIC TEST; SCINTILLATION CHARACTERISTICS; SCINTILLATION PROPERTIES; SEM; THERMAL DEPOSITION; X RAY LUMINESCENCE; X-RAY IMAGING;

CESIUM; CESIUM COMPOUNDS; CHARGE COUPLED DEVICES; DOPING (ADDITIVES); LIGHT; SCANNING ELECTRON MICROSCOPY; SCINTILLATION; SCINTILLATION COUNTERS; THALLIUM; THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY RADIOGRAPHY; X RAYS;

LUMINESCENCE;

EID: 65749099234     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.01.177     Document Type: Article

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