The X-ray quantum efficiency measurement of high resistivity CCDs

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 604, Issue 1-2, 2009, Pages 180-182

  Murray, Neil J ^a,b   Holland, Andrew D ^b   Smith, David R ^a   Gow, Jason P ^a   Pool, Peter J ^c   Burt, David J ^c  

^a BRUNEL UNIVERSITY   (United Kingdom)

^b OPEN UNIVERSITY   (United Kingdom)

^c E2V TECHNOLOGIES   (United Kingdom)

Author keywords

CCD; Deep depletion; Full depletion; High resistivity; High rho; QE; Quantum efficiency; SCD; SiLi; X ray

Indexed keywords

CCD; DEEP DEPLETION; FULL DEPLETION; HIGH RESISTIVITY; HIGH-RHO; QE; SCD; SILI;

ASTROPHYSICS; CHARGE COUPLED DEVICES; DIGITAL CAMERAS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS; X RAYS;

QUANTUM EFFICIENCY;

EID: 65749091043     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.01.052     Document Type: Article

References (5)

1. CCD42 Datasheet, e2 technologies plc.
2. Jorden P., Ball K., Bell R., Burt D.J., Guyatt N., Hadfield K., Jerram P., Pool P.J., Pike A., Holland A.D., and Murray N.J. Proc. SPIE 6276 (2006)
3. Murray N.J., Holland A.D., Pool P.J., Jorden P., Burt D.J., and Mistry P. Proc. SPIE 7021 (2008)
4. Smith D.R., Holland A.D., and Gow J.P. Nucl. Instr. and Meth. A 583 (2007) 270-277
5. Holland A.D., Turner M.J.L., Abbey A.F., and Pool P.J. Proc. SPIE 2808 (1996) 414-420