Compositional stresses in polycrystalline ceria films

ECS Transactions

Volumn 11, Issue 33, 2007, Pages 191-196

  Mandowara, Sunil ^a   Sheldon, Brian W ^a  

^a BROWN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM OXIDE; FAILURE (MECHANICAL); FILM THICKNESS; NANOCRYSTALLINE MATERIALS; NANOCRYSTALS; OXYGEN; SOLID ELECTROLYTES; SOLID STATE DEVICES;

COARSE-GRAINED MATERIALS; DEFECT CONCENTRATIONS; IN-SITU STRESS MEASUREMENT; MECHANICAL FAILURES; MONITORING CHANGE; NANO-CRYSTALLINE FILMS; OXYGEN NON-STOICHIOMETRY; OXYGEN PARTIAL PRESSURE;

STRESSES;

EID: 65749086279     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.3038922     Document Type: Conference Paper

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