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Volumn 311, Issue 10, 2009, Pages 3015-3018

Bulk ammonothermal GaN

Author keywords

A1. X ray diffraction; A2. Ammonothermal crystal growth; A2. Growth from solutions; B1. Gallium nitride

Indexed keywords

A1. X-RAY DIFFRACTION; A2. AMMONOTHERMAL CRYSTAL GROWTH; A2. GROWTH FROM SOLUTIONS; AMMONOTHERMAL; B1. GALLIUM NITRIDE; CRYSTALLINITY; HIGH QUALITY; LATTICE CURVATURE; LOW-DISLOCATION DENSITY; STRUCTURAL CHARACTERIZATION;

EID: 65749085084     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2009.01.052     Document Type: Article
Times cited : (166)

References (31)
  • 17
    • 65749101867 scopus 로고    scopus 로고
    • R.T. Dwilinski, R.M. Doradzinski, J.S. Garczynski, L.P. Sierzputowski, Y. Kanbara, Polish Patent Application No. P-347918 (06.06.2001).
    • R.T. Dwilinski, R.M. Doradzinski, J.S. Garczynski, L.P. Sierzputowski, Y. Kanbara, Polish Patent Application No. P-347918 (06.06.2001).
  • 19
    • 65749093803 scopus 로고    scopus 로고
    • R.T. Dwilinski, R.M. Doradzinski, J.S. Garczynski, L.P. Sierzputowski, Y. Kanbara, United States Patent No. 6,656,615.B2 (02.12.2003).
    • R.T. Dwilinski, R.M. Doradzinski, J.S. Garczynski, L.P. Sierzputowski, Y. Kanbara, United States Patent No. 6,656,615.B2 (02.12.2003).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.