Wetting behavior at micro-/nanoscales: Direct imaging of a microscopic water/air/solid three-phase interface

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Volumn 5, Issue 8, 2009, Pages 908-912

  Chen, Peipei ^a,c   Chen, Long ^a   Han, Dong ^a   Zhai, Jin ^b   Zheng, Yongmei ^a   Jiang, Lei ^b  

^a NATIONAL CENTER FOR NANOSCIENCE AND TECHNOLOGY   (China)

^b INSTITUTE OF CHEMISTRY   (China)

^c UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM PROBE; AIR LAYERS; ALTERNATING CURRENT; DIRECT IMAGING; FORCE-VOLUME; IN-SITU; INTERFACE SYSTEM; LOTUS LEAF; MICROMETER-SCALE; NANO SCALE; NANOSCALE STRUCTURE; WETTING BEHAVIOR;

DROP FORMATION; NANOSTRUCTURED MATERIALS; PHASE INTERFACES; WETTING;

ATOMIC FORCE MICROSCOPY;

NANOMATERIAL; WATER;

AIR; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTROMAGNETIC FIELD; PHASE TRANSITION; PLANT LEAF; ULTRASTRUCTURE;

AIR; ELECTROMAGNETIC FIELDS; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; PHASE TRANSITION; PLANT LEAVES; WATER;

EID: 65649140862     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200801152     Document Type: Article

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