High mechanical Q-factor measurements on silicon bulk samples

Journal of Physics: Conference Series

Volumn 122, Issue , 2008, Pages

  Nawrodt, R ^a   Zimmer, A ^a   Koettig, T ^a   Schwarz, C ^a   Heinert, D ^a   Hudl, M ^a   Neubert, R ^a   Thurk M ^a   Nietzsche, S ^a   Vodel, W ^a   Seidel, P ^a   Tunnermann A ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65649136537     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/122/1/012008     Document Type: Article

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