Surface characterization of Ag-ITO cermet films prepared by a new sol-gel method

Thin Solid Films

Volumn 517, Issue 17, 2009, Pages 4979-4983

  Yang, L L ^a   He, X D ^a   He, F ^a   Li, Y B ^a   Zhang, S ^b   An, T ^c   Zheng, W T ^c  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

Ag ITO cermet film; Sol gel process; Surface structure; X ray diffusion scattering

Indexed keywords

AG-ITO CERMET FILM; CERMET FILMS; CRYSTALLIZATION TEMPERATURE; DURATION TIME; HIERARCHICAL STRUCTURES; HIGH QUALITY; INDIUM OXIDE; INDIUM TIN OXIDE FILMS; ITO FILMS; MODIFIED SOL-GEL METHOD; NANOCOMPOSITE FILM; NANOCOMPOSITE THIN FILMS; REDUCTION AGENTS; SILVER NANOPARTICLES; SILVER OXIDES; SOL-GEL METHODS; STANNOUS CHLORIDE; SURFACE CHARACTERIZATION; TRANSPARENT OXIDES; X-RAY DIFFUSE SCATTERING; X-RAY DIFFUSION SCATTERING; X-RAY PHOTOELECTRON SPECTROSCOPE; XPS;

CERMETS; CHLORINE COMPOUNDS; FILM PREPARATION; GELATION; GELS; INDIUM; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; OXIDE FILMS; SCATTERING; SILVER COMPOUNDS; SOL-GEL PROCESS; SOL-GELS; SOLS; SURFACE DIFFUSION; SURFACE STRUCTURE; TIN; X RAYS;

SILVER;

EID: 65649133065     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.03.008     Document Type: Article

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