Can direct electron detectors outperform phosphor-CCD systems for TEM?

Journal of Physics: Conference Series

Volumn 126, Issue , 2008, Pages

  Moldovan, Grigore ^a   Li, Xiaobing ^a   Kirkland, Angus ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65649123837     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/126/1/012089     Document Type: Article

References (4)

1. Meyer R R and A Kirkland 2000 Microscopy Res. Technique 49 269-280
2. Deptuch G, A Besson, P Rehak, M Szelezniak, J Wall, M Winter and Y Zhu 2007 Ultramicroscopy 107 674-684
3. AR Faruqi, R Henderson and L Thistos 2005 Nucl. Instrum. Methods Phys. Research A 546 160-163
4. Moldovan G, X Li, P Wilshaw and A Kirkland 2007 IWORID 9 proceedings, in press