The lhcf detector at the cern large hadron collider

Journal of Instrumentation

Volumn 3, Issue 8, 2008, Pages

  Adriani, O ^a   Bonechi, L ^a   Bongi, M ^b   Castellini, G ^b   D'Alessandro, R ^a   Faus, D A ^c   Fukui, K ^d   Grandi, M ^b   Haguenauer, M ^e   Itow, Y ^d   Kasahara, K ^f   Macina, D ^g   Mase, T ^d   Masuda, K ^d   Matsubara, Y ^d   Menjo, H ^d   Mizuishi, M ^f   Muraki, Y ^h   Papini, P ^b   Perrot, A L ^g   Ricciarini, S ^b   Sako, T ^d   Shimizu, Y ^f   Taki, K ^d   Tamura, T ⁱ   Torii, S ^f   Tricomi, A ^j   Turner, W C ^k   Velasco, J ^c   Viciani, A ^b   Watanabe, H ^d   Yoshida, K ^l   more..

^a UNIVERSITY OF FLORENCE   (Italy)

^b INFN SEZIONE DI FIRENZE   (Italy)

^c CSIC   (Spain)

^d NAGOYA UNIVERSITY   (Japan)

^e ECOLE POLYTECHNIQUE   (France)

^f WASEDA UNIVERSITY   (Japan)

^g CERN   (Switzerland)

^h KONAN UNIVERSITY   (Japan)

ⁱ KANAGAWA UNIVERSITY   (Japan)

^j UNIVERSITY OF CATANIA   (Italy)

^k LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^l SHIBAURA INSTITUTE OF TECHNOLOGY   (Japan)

more..

Author keywords

Analysis and statistical methods; Calorimeters; Data acquisition concepts; Detector alignment and calibration methods; Detector control systems; Front end electronics for detector readout; Gamma detectors; Overall mechanics design; Particle detectors; Particle identification methods; Particle tracking detectors; Pattern recognition, cluster finding, calibration and fitting methods; Photon detectors for UV, visible and IR photons; Radiation damage to detector materials; Scintillators and scintillating fibers and light guides; Scintillators, scintillation and light emission processes; Simulation methods and programs; Solid state detectors; Trigger concepts and systems

Indexed keywords

CALIBRATION METHOD; DETECTOR CONTROL SYSTEMS; DETECTOR MATERIALS; DETECTOR READOUT; EMISSION PROCESS; FITTING METHOD; GAMMA DETECTORS; PARTICLE IDENTIFICATION METHOD; PARTICLE TRACKING; PHOTON DETECTOR; SCINTILLATING FIBER; SOLID STATE DETECTORS;

CALIBRATION; CALORIMETERS; CONTROL SYSTEM ANALYSIS; DATA ACQUISITION; HADRONS; IDENTIFICATION (CONTROL SYSTEMS); IONIZATION; LUMINANCE; OPTICAL FIBERS; PARTICLE DETECTORS; PATTERN RECOGNITION; PHOTONS; RADIATION DAMAGE; SCINTILLATION; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; TELLURIUM COMPOUNDS;

EXCHANGE INTERACTIONS;

EID: 65649121715     PISSN: 17480221     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/3/08/S08006     Document Type: Article

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