Influence of the sample mounting on thermal conductance measurements using PPMS TTO option

Journal of Physics: Conference Series

Volumn 150, Issue , 2009, Pages

  Sebek, J ^a   Santava, E ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65649115496     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/150/1/012044     Document Type: Article

References (4)

1. Maldonado O 1992 Cryogenics 32 908
2. Torizuki K and Tajima H 2005 Rev. Sci. Instrum 76 033908
3. Rudajevova A, Svantner M, Vasylyev D, Musil O, Lang V 2006 Int J Thermophysics 27 1241
4. purity of 99%, Electronic grade nickel, ED FAGAN Inc., http://www.edfagan.com/