Final state effect for Au 4f line from gold-nano-particles grown on oxides and HOPG supports

Surface Science

Volumn 603, Issue 13, 2009, Pages 2108-2114

  Kitsudo, Y ^a   Iwamoto, A ^a   Matsumoto, H ^a   Mitsuhara, K ^a   Nishimura, T ^a   Takizawa, M ^a   Akita, T ^b   Maeda, Y ^b   Kido, Y ^a  

^a RITSUMEIKAN UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Au 4f line; Au nano particles; Final state effect; Medium energy ion scattering; Photoelectron spectroscopy; Scanning electron microscope of a field emission type

Indexed keywords

AU 4F LINE; AU NANO-PARTICLES; FINAL STATE EFFECT; MEDIUM ENERGY ION SCATTERING; SCANNING ELECTRON MICROSCOPE OF A FIELD-EMISSION TYPE;

ATOMS; BINDING ENERGY; ELECTRON MICROSCOPES; ELECTRONS; EMISSION SPECTROSCOPY; FIELD EMISSION; HIGH RESOLUTION ELECTRON MICROSCOPY; IONS; NANOPARTICLES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PHOTOIONIZATION; PHOTONS; PLASMA INTERACTIONS; SCANNING; SCANNING ELECTRON MICROSCOPY; SCATTERING; SPECTRUM ANALYSIS; SURFACE RELAXATION;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 65549166807     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2009.04.008     Document Type: Article

References (36)

1. Haruta M., Kobayashi T., Sano H., and Yamada N. Chem. Lett. 2 (1987) 405
2. Haruta M. Catal. Today 36 (1997) 153
3. Valden M., Lai X., and Goodman D.W. Science 281 (1998) 1647
4. Wertheim G.K., DiCenzo S.B., and Buchanan D.N.E. Phys. Rev. B 33 (1986) 5384
5. Freund H.-J. Surf. Sci. 500 (2002) 271
6. Maeda Y., Okumura M., Tsubota S., Kohyama M., and Haruta M. Appl. Surf. Sci. 222 (2004) 409
7. Sanchez A., Abbet S., Heiz U., Schneider W.D., Häkkinen H., Barnett R.N., and Landman U. J. Phys. Chem. A 103 (1999) 9573
8. Molina L.M., and Hammer B. Phys. Rev. B 69 (2004) 155424
9. Okazaki K., Morikawa Y., Tanaka S., Tanaka K., and Kohyama M. Phys. Rev. B 69 (2004) 235404
10. Minato T., Susaki T., Shiraki S., Kato H.S., Kawai M., and Aika K.-I. Surf. Sci. 566-568 (2004) 1012
11. Wang J.G., and Hammer B. Phys. Rev. Lett. 97 (2006) 136107
12. Okazawa T., Kohyama M., and Kido Y. Surf. Sci. 600 (2006) 4430
13. Howard A., Clark D.N.S., Mitchell C.E.J., Egdell R.G., and Dhanak V.R. Surf. Sci. 518 (2002) 210
14. Chen M.S., and Goodman D.W. Catal. Today 111 (2006) 22
15. Wertheim G.K., DiCenzo S.B., and Youngquist S.E. Phys. Rev. Lett. 51 (1983) 2310
16. Hövel H., Grimm B., Pollmann M., and Reihl B. Phys. Rev. Lett. 81 (1998) 4608
17. Ohgi T., and Fujita D. Phys. Rev. B 66 (2002) 115410
18. Tanaka A., Takeda Y., Nagasawa T., and Takahashi K. Solid State Commun. 126 (2003) 191
19. Büttner M., and Oelhafen P. Surf. Sci. 600 (2006) 1170
20. Kido Y., Namba H., Nishimura T., Ikeda A., Yan Y., and Yagishita A. Nucl. Instrum. Methods B 136-138 (1998) 798
21. Namba H., Obara M., Kawakami D., Nishimura T., Yan Y., Yagishita A., and Kido Y. J. Synchrotron Radiat. 5 (1998) 557
22. Nishimura T., Ikeda A., and Kido Y. Rev. Sci. Instrum. 69 (1998) 1671
23. Iwamoto A., Okazawa T., Akita T., Vickridge I., and Kido Y. Nucl. Instrum. Methods B 266 (2008) 965
24. Nishimura T., Ikeda A., Namba H., Morishita T., and Kido Y. Surf. Sci. 421 (1999) 273
25. Okazawa T., Fujiwara M., Nishimura T., Akita T., Kohyama M., and Kido Y. Surf. Sci. 600 (2006) 1331
26. Okazawa T., Nishizawa T., Nishimura T., and Kido Y. Phys. Rev. B 75 (2007) 033413
27. Nishimura T., Hoshino Y., Okazawa T., and Kido Y. Phys. Rev. B 77 (2008) 073405
28. Blum B., Salvarezza R.C., and Ariva A.J. J. Vac. Sci. Technol. B 17 (1999) 2431
29. J. Lindhard, M. Scharff, K. Dan. Vidensk. Selsk. Mat.-Fys. Medd. 27 (1953) 15.
30. Crasemann B., Chen M.H., and Mark H. J. Opt. Soc. Am. B 1 (1984) 224
31. Drescher M., Hentschel M., Kienberger R., Uiberacker M., Yakovlev V., Schrinzi A., Westerwalbesloh Th., Kleineberg U., Heinzmann U., and Krausz F. Nature 419 (2002) 803
32. Tanuma S., Shiratori T., Kimura T., Goto K., Ichimura S., and Powell C.J. Surf. Interface Anal. 37 (2005) 833
33. DoCenzo S.B., Berry S.D., and Hartford Jr. E.H. Phys. Rev. B 38 (1989) 8465
34. Kleiman G.G., Landers R., Nascente P.A., and de Castero S.G.C. Phys. Rev. B 46 (1992) 4405
35. Luo K., Lai X., Yi C.-W., Davies K.A., Gath K.K., and Goodman D.W. J. Phys. Chem. 109 (2005) 4064
36. Lopez-Salido I., Lim D.C., Dietsche R., Bertram N., and Kim Y.D. J. Phys. Chem. B 110 (2006) 1128