SCOPUS 정보 검색 플랫폼

Russian Journal of Electrochemistry

Volumn 45, Issue 4, 2009, Pages 470-475

Studies of thermal stability of nanocrystalline SnO2, ZrO 2, and SiC for semiconductor and thermocatalytic gas sensors

(6) Pavelko, R G a Vasil'Ev, A A b,c Sevast'Yanov, V G a Gispert Guirado, F c Vilanova, X c Kuznetsov, N T a

a KURNAKOV INSTITUTE OF GENERAL AND INORGANIC CHEMISTRY (Russian Federation)

b KURCHATOV INSTITUTE (Russian Federation)

c UNIVERSITAT ROVIRA I VIRGILI (Spain)

Author keywords

Gas sensors; Silicon carbide; Thermal stability; Tin oxide; Zirconium oxide

Indexed keywords

AVERAGE SIZES; COMMERCIAL MATERIALS; CRYSTALLITE GROWTHS; GAS SENSORS; IMPURITY CONTENTS; LONG-TERM STABILITIES; NANO-CRYSTALLINE; NANO-POWDERS; SCHERRER METHODS; THERMAL STABILITY; X-RAY PHASE ANALYSIS; ZIRCONIUM OXIDE;

CRYSTALLITES; ELECTRIC CONDUCTIVITY; GAS DETECTORS; GROWTH KINETICS; ISOTHERMAL ANNEALING; NANOSTRUCTURED MATERIALS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR GROWTH; SEMICONDUCTOR MATERIALS; SENSORS; SILICON CARBIDE; TIN; TITANIUM COMPOUNDS; ZIRCONIA; ZIRCONIUM; ZIRCONIUM ALLOYS;

THERMODYNAMIC STABILITY;

EID: 65549147131 PISSN: 10231935 EISSN: 16083342 Source Type: Journal
DOI: 10.1134/S1023193509040181 Document Type: Conference Paper

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.