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Physical Review Letters

Volumn 102, Issue 17, 2009, Pages

Ultrasensitive beam deflection measurement via interferometric weak value amplification

(4) Dixon, P Ben a Starling, David J a Jordan, Andrew N a Howell, John C a

a UNIVERSITY OF ROCHESTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DEFLECTIONS; BEAM DEFLECTION MEASUREMENTS; DEGREES OF FREEDOMS; OPTICAL AMPLIFIERS; OPTICAL BEAMS; PIEZO ACTUATORS; POLARIZATION INDEPENDENTS; SAGNAC INTERFEROMETERS; TRANSVERSE DEFLECTIONS; ULTRASENSITIVE; WEAK VALUES;

DEFLECTION (STRUCTURES); INTERFEROMETRY; LIGHT AMPLIFIERS; OPTOELECTRONIC DEVICES;

AMPLIFICATION;

EID: 65549090038 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.102.173601 Document Type: Article

Times cited : (767)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.