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Volumn 642, Issue 1-2, 2009, Pages 127-134

Using scattering and absorption spectra as MCR-hard model constraints for diffuse reflectance measurements of tablets

Author keywords

Diffuse reflectance; Multivariate curve resolution; Multivariate curve resolution alternating least square; Scatter correction; Scattering coefficient

Indexed keywords

DIFFUSE REFLECTANCE; MULTIVARIATE CURVE RESOLUTION; MULTIVARIATE CURVE RESOLUTION-ALTERNATING LEAST SQUARE; SCATTER CORRECTION; SCATTERING COEFFICIENT;

EID: 65449178764     PISSN: 00032670     EISSN: 18734324     Source Type: Journal    
DOI: 10.1016/j.aca.2009.01.057     Document Type: Article
Times cited : (44)

References (32)
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  • 17
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    • Optische Spektroskopie online und inline I: Festkörper und Oberflächen
    • Kessler R.W. (Ed), Wiley-VCH, Germany
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    • (2006) Prozessanalytik , pp. 255
    • Kessler, R.W.1
  • 32
    • 65449185974 scopus 로고
    • Verga Scheggi A.M., Martellucci S., Chester A.N., and Pratesi R. (Eds), Kluwer Academic, Erice Sicily
    • Jaques S.L. In: Verga Scheggi A.M., Martellucci S., Chester A.N., and Pratesi R. (Eds). Proc. of the Nato Adv. Sc. Inst. (1995), Kluwer Academic, Erice Sicily
    • (1995) Proc. of the Nato Adv. Sc. Inst.
    • Jaques, S.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.