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Volumn 603, Issue 3, 2009, Pages 467-484
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Local alignment of the BaBar Silicon Vertex Tracking detector
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Author keywords
Alignment; Aplanar; Beam boost; Curvature; Derivatives; Detector; Distortion; Minimization; Silicon; Tracking; Validation
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Indexed keywords
APLANAR;
BEAM BOOST;
CURVATURE;
DISTORTION;
MINIMIZATION;
TRACKING;
VALIDATION;
ALIGNMENT;
DETECTORS;
NONMETALS;
OPTIMIZATION;
PARTICLE BEAM TRACKING;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON DETECTORS;
SILICON WAFERS;
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EID: 65449162597
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2009.02.001 Document Type: Article |
Times cited : (20)
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References (14)
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