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Volumn 4, Issue 2, 2009, Pages 179-189
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Cold atom interferometers and their applications in precision measurements
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Author keywords
Atom interferometer; Cold atom; Precision measurement
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Indexed keywords
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EID: 65449146774
PISSN: 16733487
EISSN: 16733606
Source Type: Journal
DOI: 10.1007/s11467-009-0045-3 Document Type: Review |
Times cited : (22)
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References (33)
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