Development of non-stoichiometric SrBi4+2xTi4 O15+3x (-0.04 ≤ x ≤ 0.04) ceramics

Advances in Applied Ceramics

Volumn 108, Issue 2, 2009, Pages 102-105

  Wei, Y F ^a   Yang, C F ^b   Chen, C Y ^c   Huang, C J ^b   Kao, C H ^d  

^a KAO YUAN UNIVERSITY   (Taiwan)

^b NATIONAL UNIVERSITY OF KAOHSIUNG   (Taiwan)

^c CHENG SHIU UNIVERSITY   (Taiwan)

^d NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

Author keywords

Curie temperature; Dielectric property; SrBi4+2xTi4 O15+3x ceramics; X ray method

Indexed keywords

BULK DENSITIES; COMPOSITIONAL VARIATIONS; DIELECTRIC CHARACTERISTICS; DIELECTRIC CONSTANTS; GRAIN MORPHOLOGIES; NON-STOICHIOMETRIC COMPOSITIONS; SRBI4+2XTI4 O15+3X CERAMICS; TEMPERATURE CURVES; X-RAY DIFFRACTION PATTERNS; X-RAY METHOD; X-RAY PATTERNS;

CERAMIC CAPACITORS; CURIE TEMPERATURE; DIELECTRIC PROPERTIES; DIFFRACTION; FERROELECTRIC MATERIALS; GRAIN GROWTH; HOLOGRAPHIC INTERFEROMETRY; SCANNING; SCANNING ELECTRON MICROSCOPY; SINTERING; X RAY ANALYSIS;

CERAMIC MATERIALS;

EID: 65449143251     PISSN: 17436753     EISSN: 17436761     Source Type: Journal    
DOI: 10.1179/174367608X319294     Document Type: Article

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