Growth and characterization of thin films prepared from perfluoro-isopropyl-substituted perfluorophthalocyanines

Thin Solid Films

Volumn 517, Issue 15, 2009, Pages 4379-4384

  Keil, C ^a   Tsaryova, O ^b   Lapok, L ^b   Himcinschi, C ^c   Wohrle D ^d   Hild, O R ^e   Zahn, D R T ^c   Gorun, S M ^b   Schlettwein, D ^a  

^a JUSTUS LIEBIG UNIVERSITY   (Germany)

^b NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^c CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^d UNIVERSITY OF BREMEN   (Germany)

^e FRAUNHOFER INSTITUTE FOR PHOTONIC MICROSYSTEMS   (Germany)

Author keywords

Conductivity; Ellipsometry; Growth mechanism; Optical spectroscopy; Organic semiconductors; Physical vapor deposition

Indexed keywords

COLORED THIN FILMS; CONDUCTIVITY; ELECTRICAL CONDUCTIONS; ELECTRON ACCEPTORS; ELECTRONIC COUPLINGS; GROWTH MECHANISM; IN-SITU; INDEPENDENT CHARACTERS; OPTICAL SPECTROSCOPY; OPTICAL TRANSMISSION MEASUREMENTS; ORGANIC SEMICONDUCTORS; POTENTIAL APPLICATIONS;

CRYSTALS; ELECTRIC CONDUCTIVITY; OPTICAL CONDUCTIVITY; OPTICAL PROPERTIES; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR GROWTH; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; VAPORS;

OPTICAL FILMS;

EID: 65449129548     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.01.070     Document Type: Article

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