Peak-fitting of high resolution ToF-SIMS spectra: A preliminary study

Surface and Interface Analysis

Volumn 41, Issue 4, 2009, Pages 265-268

  Abel, M L ^a   Shimizu, K ^a   Holliman, M ^a   Watts, J F ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Charging; Peak fitting; Quantification; Roughness; ToF SIMS

Indexed keywords

CHARGING; PEAK-FITTING; QUANTIFICATION; ROUGHNESS; TOF-SIMS;

ALUMINUM; FULL WIDTH AT HALF MAXIMUM; PLASTIC FILMS; POLYDISPERSITY; SECONDARY ION MASS SPECTROMETRY; SURFACE ROUGHNESS; TIME SERIES ANALYSIS;

POLYMER FILMS;

EID: 65349185107     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3036     Document Type: Article

References (5)

1. S. R. Leadley, J. F. Watts, J. Adhes. 1997, 60, 175.
2. S. R. Leadley, J. F. Watts, J. Elec. Spec. 1997, 85, 107.
3. K. Shimizu, M.-L. Abel, J. F. Watts, 2008, (unpublished results).
4. K. Shimizu, M.-L. Abel, J. F. Watts, J. Adhes. 2008, 84, 725.
5. I. Gilmore, in ToF-SIMS: Surface Analysis by Mass Spectrometry, (Eds: J. C. Vickerman, D. Briggs), IM Publications, Chichester, UK and Surface Spectra Limited, Manchester, UK, 2001, p. 261.