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Volumn 113, Issue 14, 2009, Pages 5345-5348

High-resolution line width measurement of single CdSe nanocrystals at long time scales

Author keywords

[No Author keywords available]

Indexed keywords

ASYMPTOTIC LIMITS; BAND-EDGE PHOTOLUMINESCENCES; CDSE NANOCRYSTALS; DIRECT DETECTIONS; EXPOSURE TIME; FABRY-PEROT SPECTROMETERS; HIGH RESOLUTIONS; LINE SHAPES; LINE WIDTHS; LINE-WIDTH MEASUREMENTS; ORDERS OF MAGNITUDES; PHYSICAL PROCESS; SINGLE NANOCRYSTALS; SPECTRAL DIFFUSIONS; TIME-SCALE; TIME-SCALES; UPPER BOUNDS; UPPER LIMITS;

EID: 65349141839     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp900887r     Document Type: Article
Times cited : (12)

References (20)
  • 3
    • 56249098912 scopus 로고    scopus 로고
    • Press, D.; Ladd, V.; B Zhang, B.; Yamamoto, Y. Nature 2008, 456, 218-221.
    • Press, D.; Ladd, V.; B Zhang, B.; Yamamoto, Y. Nature 2008, 456, 218-221.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.