Ellipsometry of GeO2 films with Ge nanoclusters: Influence of the quantum-size effect on refractive index

Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

Volumn 106, Issue 3, 2009, Pages 436-440

  Marin, D V ^a   Gorokhov, E B ^a   Borisov, A G ^a   Volodin, V A ^a,b  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

^b NOVOSIBIRSK STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BRUGGEMAN MODELS; COMPLEX PERMITTIVITIES; CONTACT LESS; EFFECTIVE MEDIUMS; LASER ELLIPSOMETRIES; MOLE RATIOS; QUANTITATIVE ANALYSIS; QUANTUM-SIZE EFFECTS; RAMAN SCATTERING SPECTROSCOPIES; SPECTRAL DEPENDENCES; THEORETICAL MODELS;

CHEMICAL ANALYSIS; ELLIPSOMETRY; GERMANIUM; PERMITTIVITY; REFRACTIVE INDEX;

NANOCLUSTERS;

EID: 65349111197     PISSN: 0030400X     EISSN: 15626911     Source Type: Journal    
DOI: 10.1134/S0030400X09030205     Document Type: Article

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