Ferromagnetic resonance properties and anisotropy of Ni-Mn-Ga thin films of different thicknesses deposited on Si substrate

Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

  Golub, Vladimir ^a   Reddy, K M ^b   Chernenko, Volodymyr ^a   Müllner, Peter ^c   Punnoose, Alex ^b   Ohtsuka, Makoto ^d  

^a INSTITUTE OF MAGNETISM   (Ukraine)

^b BOISE STATE UNIVERSITY   (United States)

^c Boise State University   (United States)

^d TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION MAXIMUM; DATA ANALYSIS; EASY AXIS; EXTERNAL MAGNETIC FIELDS; FERROMAGNETIC RESONANCE PROPERTIES; FIBER TEXTURES; FILM PLANES; HIGH VACUUMS; MAGNETIC PROPERTIES OF THIN FILMS; NI-MN-GA; NI-MN-GA THIN FILMS; RESONANCE LINE WIDTHS; ROOM TEMPERATURES; SI (100) SUBSTRATES; SI SUBSTRATES; UNIAXIAL ANISOTROPY CONSTANTS;

ANISOTROPY; ELECTRODEPOSITION; FERROMAGNETIC MATERIALS; FERROMAGNETIC RESONANCE; FERROMAGNETISM; GALLIUM; GALLIUM ALLOYS; MAGNETIC FIELDS; MAGNETIC PROPERTIES; MANGANESE; MANGANESE COMPOUNDS; NICKEL; RESONANCE; SEMICONDUCTING SILICON COMPOUNDS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

MAGNETIC THIN FILMS;

EID: 65249187657     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3075395     Document Type: Article

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