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Volumn 105, Issue 7, 2009, Pages

Magnetic characterization of ultrathin EuO films with XMCD

(8) Negusse, Ezana a Dvorak, J a Holroyd, J S a Liberati, M a,b Santos, T S c,d Moodera, J S c Arenholz, E b Idzerda, Y U a

a MONTANA STATE UNIVERSITY (United States)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

c MASSACHUSETTS INSTITUTE OF TECHNOLOGY (United States)

d ARGONNE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CU ELECTRODES; HIGH QUALITIES; MAGNETIC CHARACTERIZATIONS; OXIDATION FREE; SATURATION MOMENTS; SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MAGNETOMETRIES; THEORETICAL CALCULATIONS; X-RAY ABSORPTION SPECTROSCOPIES; X-RAY MAGNETIC CIRCULAR DICHROISMS;

CHROMIUM; CIRCULAR DICHROISM SPECTROSCOPY; DICHROISM; EUROPIUM; MAGNETIC PROPERTIES; QUANTUM INTERFERENCE DEVICES; SUPERCONDUCTING FILMS; SUPERCONDUCTING MAGNETS; ULTRATHIN FILMS; X RAY SPECTROSCOPY;

COPPER;

EID: 65249179712 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3076044 Document Type: Article

Times cited : (14)

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