-
1
-
-
18944384803
-
-
Dohi, T., S. Osaki, and K.S. Trivedi, An Infinite Server Queuing Approach For Describing Software Reliability Growth - Unified Modeling And Estimation Framework -, Proceedings Of The 11th Asia-Pacific Software Engineering Conference (APSEC'04), pp. 110-119, 2004.
-
(2004)
An Infinite Server Queuing Approach For Describing Software Reliability Growth - Unified Modeling And Estimation Framework -, Proceedings Of The 11th Asia-Pacific Software Engineering Conference (APSEC'04)
, pp. 110-119
-
-
Dohi, T.1
Osaki, S.2
Trivedi, K.S.3
-
2
-
-
0030401545
-
Unification of Finite Failure Non-Homogeneous Poisson Process Models through Test Coverage
-
White Plains, NY, pp
-
Gokhale S.S., T. Philip, P.N. Marinos and K.S. Trivedi, Unification of Finite Failure Non-Homogeneous Poisson Process Models through Test Coverage, In Proc. Intl. Symposium on Software Reliability Engineering (ISSRE 96), White Plains, NY, pp. 289-299, 1996.
-
(1996)
Proc. Intl. Symposium on Software Reliability Engineering (ISSRE
, vol.96
, pp. 289-299
-
-
Gokhale, S.S.1
Philip, T.2
Marinos, P.N.3
Trivedi, K.S.4
-
3
-
-
65249183054
-
-
Ph.D. Thesis, Doctoral Program of Graduate School of Engineering, Tottori University, Japan
-
Inoue, S., A study on Stochastic Modelling for Accurate Software Reliability Assessment, Ph.D. Thesis, Doctoral Program of Graduate School of Engineering, Tottori University, Japan, 2006.
-
(2006)
A study on Stochastic Modelling for Accurate Software Reliability Assessment
-
-
Inoue, S.1
-
4
-
-
85181152621
-
-
Kapur P. K., H. Pham, S. Anand and K. Yadav, A Unified Approach for Developing Software Reliability Growth Models in the Presence of Imperfect Debugging and Error Generation, 2008, submitted to IEEE Transactions on Software Reliability.
-
Kapur P. K., H. Pham, S. Anand and K. Yadav, A Unified Approach for Developing Software Reliability Growth Models in the Presence of Imperfect Debugging and Error Generation, 2008, submitted to IEEE Transactions on Software Reliability.
-
-
-
-
5
-
-
67849093075
-
A Unified Modeling Framework Incorporating Change Point For Measuring Reliability Growth During Software Testing
-
to appear in
-
Kapur P.K., J. Kumar and R. Kumar, A Unified Modeling Framework Incorporating Change Point For Measuring Reliability Growth During Software Testing to appear in OPSEARCH.
-
OPSEARCH
-
-
Kapur, P.K.1
Kumar, J.2
Kumar, R.3
-
9
-
-
85181054932
-
-
Schneidewind, N.F, Analysis Of Error Processes In Computer Software, Sigplan Notices, 10, pp. 337-346, 1975
-
Schneidewind, N.F., Analysis Of Error Processes In Computer Software, Sigplan Notices, Vol. 10, pp. 337-346, 1975.
-
-
-
-
10
-
-
0019682019
-
A General Software Reliability Model For Performance Prediction
-
Shanthikumar, J. G., A General Software Reliability Model For Performance Prediction, Microelectronics Reliability, Vol. 21, pp. 671-682, 1981.
-
(1981)
Microelectronics Reliability
, vol.21
, pp. 671-682
-
-
Shanthikumar, J.G.1
-
11
-
-
34250684955
-
A Study Of The Modeling And Analysis Of Software Fault-Detection And Fault-Correction Processes
-
Xie, M., Q.P. Hu, Y.P. Wu and S.H. Ng., A Study Of The Modeling And Analysis Of Software Fault-Detection And Fault-Correction Processes, Quality And Reliability Engineering International, Vol. 23, No. 4, pp. 459-470, 2007.
-
(2007)
Quality And Reliability Engineering International
, vol.23
, Issue.4
, pp. 459-470
-
-
Xie, M.1
Hu, Q.P.2
Wu, Y.P.3
Ng, S.H.4
-
12
-
-
85063922663
-
-
May, pp
-
Xie, M. and M. Zhao, The Schneidewind Software Reliability Model Revisited, Proceedings of The 3rd International Symposium On Software Reliability Engineering, May, pp.184-192, 1992.
-
(1992)
The Schneidewind Software Reliability Model Revisited, Proceedings of The 3rd International Symposium On Software Reliability Engineering
, pp. 184-192
-
-
Xie, M.1
Zhao, M.2
-
13
-
-
0021006179
-
S-Shaped Software Reliability Growth Modeling For Software Error Detection
-
Yamada, S., M. Obha and S. Osaki, S-Shaped Software Reliability Growth Modeling For Software Error Detection, IEEE Trans. On Reliability, Vol. R-32, No. 5, pp. 475-484, 1983.
-
(1983)
IEEE Trans. On Reliability
, vol.R-32
, Issue.5
, pp. 475-484
-
-
Yamada, S.1
Obha, M.2
Osaki, S.3
|