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Volumn 142, Issue , 2008, Pages
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Electric field analysis using Schwarz-Christoffel mapping
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 65249154720
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/142/1/012029 Document Type: Article |
Times cited : (6)
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References (4)
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