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Volumn 133, Issue , 2008, Pages

Influence of inelastic processes on fast-atom-surface diffraction

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EID: 65249139961     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/133/1/012014     Document Type: Article
Times cited : (4)

References (23)
  • 8
    • 65249142744 scopus 로고
    • Burgdörfer J 1993 in Review of Fundamental Processes and Applications of Atoms and Ions" ed CD Lin (World Scientific, Singapore)
    • (1993) In
    • Burgdörfer, J.1
  • 12
    • 33947510438 scopus 로고    scopus 로고
    • Seliger M et al 2007 Phys. Rev. A 75 032714 and Refs. therein
    • (2007) Phys. Rev. , vol.75 , Issue.3 , pp. 032714
    • Seliger, M.1    Al, E.2
  • 21
    • 65249118253 scopus 로고    scopus 로고
    • Lischka H et al 2006 computer code COLUMBUS, Release 5.9
    • (2006)
    • Lischka, H.1    Al, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.