Numerical analysis on power loss mechanism of Fe55 Al18 O27 thin films for conduction noise through microstrip line

Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

  Ryu, Gi Bong ^a   Kim, Sung Soo ^a  

^a Chungbuk National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EDDY-CURRENT LOSS; ELECTRICAL PROPERTIES; ELECTRICAL RESISTIVITIES; FINITE ELEMENTS; FREQUENCY RANGES; HIGH MAGNETIC LOSS; MAGNETIC LOSS; MATERIAL PARAMETERS; OHMIC LOSS; POWER ABSORPTIONS; POWER DISSIPATIONS; POWER LOSS; REFLECTION LOSS; S PARAMETERS; SIMULATION MODELS; STRIP CONDUCTORS;

ABSORPTION; ELECTRIC FIELDS; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; MAGNETIC FIELDS; MAGNETIC MATERIALS; MICROSTRIP LINES; THIN FILM DEVICES; THIN FILMS;

ELECTRIC LOSSES;

EID: 65249129048     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3068014     Document Type: Article

References (5)

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